Journal Article

PreJuSER-49699

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Ionic conduction in zirconia films on nanometer thickness

Guo, X.FZJ* ; Vasco, E. ; Mi, S. ; Szot, K.FZJ* ; Wachsman, E. ; Waser, R.FZJ*

2005
Elsevier Science Amsterdam [u.a.]

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Please use a persistent id in citations: doi:10.1016/j.actamat.2005.07.033

Abstract: Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Keyword(s): J ; zirconia (auto) ; nanostructure (auto) ; electrical properties (auto) ; laser deposition (auto)

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektronische Materialien (IFF-IEM)

Research Program(s):

1. Kondensierte Materie (M02)

Appears in the scientific report 2005

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