TY  - JOUR
AU  - Guo, X.
AU  - Vasco, E.
AU  - Mi, S.
AU  - Szot, K.
AU  - Wachsman, E.
AU  - Waser, R.
TI  - Ionic conduction in zirconia films on nanometer thickness
JO  - Acta materialia
VL  - 53
SN  - 1359-6454
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - PreJuSER-49699
SP  - 5161
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000232859000020
DO  - DOI:10.1016/j.actamat.2005.07.033
UR  - https://juser.fz-juelich.de/record/49699
ER  -