001     49718
005     20180211180954.0
024 7 _ |2 DOI
|a 10.1080/00150190500316531
024 7 _ |2 WOS
|a WOS:000234250400017
037 _ _ |a PreJuSER-49718
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Thomas, R.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB35139
245 _ _ |a High-k dielectric materials by metalorganic chemical vapor deposition: growth and characterization
260 _ _ |a London [u.a.]
|b Taylor & Francis
|c 2005
300 _ _ |a 111
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Ferroelectrics
|x 0015-0193
|0 2058
|v 327
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Two novel mononuclear mixed alkoxide compounds of Ti and Zr, [Ti(OPri)(2) (tbaoac)(2)] and [Zr(OPri)(2) (tbaoac)(2)], were synthesised and characterised. These complexes are highly soluble and possess superior thermal properties showing promising characteristics as precursors for MOCVD of oxide thin films. Results are presented for thin films, which were deposited in a liquid injection metal-organic chemical vapour deposition production tool. Special emphasis is given to the properties of ZrO2 thin films within MIS structures as proposed for gate oxide applications and to the compatibility of the new Ti precursor with a standard Sr(thd)(2) precursor for low temperature deposition of SrTiO3.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|c I01
|2 G:(DE-HGF)
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a MOCVD
653 2 0 |2 Author
|a precursors
653 2 0 |2 Author
|a TiO2
653 2 0 |2 Author
|a ZrO2
653 2 0 |2 Author
|a SrTiO3
653 2 0 |2 Author
|a high-k dielectrics
700 1 _ |a Regnery, S.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB3071
700 1 _ |a Ehrhart, P.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB3072
700 1 _ |a Waser, R.
|b 3
|u FZJ
|0 P:(DE-Juel1)131022
700 1 _ |a Patil, U.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Bhakta, R.
|b 5
|u FZJ
|0 P:(DE-Juel1)VDB43056
700 1 _ |a Devi, A.
|b 6
|0 P:(DE-HGF)0
773 _ _ |a 10.1080/00150190500316531
|g Vol. 327, p. 111
|p 111
|q 327<111
|0 PERI:(DE-600)2042895-9
|t Ferroelectrics
|v 327
|y 2005
|x 0015-0193
856 7 _ |u http://dx.doi.org/10.1080/00150190500316531
909 C O |o oai:juser.fz-juelich.de:49718
|p VDB
913 1 _ |k I01
|v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|l Informationstechnologie mit nanoelektronischen Systemen
|b Information
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|x 0
914 1 _ |y 2005
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IFF-IEM
|l Elektronische Materialien
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB321
|x 0
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
|0 I:(DE-Juel1)VDB381
|x 1
970 _ _ |a VDB:(DE-Juel1)77764
980 _ _ |a VDB
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980 _ _ |a journal
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980 _ _ |a I:(DE-Juel1)VDB381
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
981 _ _ |a I:(DE-Juel1)VDB381


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