000049728 001__ 49728 000049728 005__ 20200423204301.0 000049728 017__ $$aThis version is available at the following Publisher URL: http://jap.aip.org 000049728 0247_ $$2DOI$$a10.1063/1.1888046 000049728 0247_ $$2WOS$$aWOS:000229155600047 000049728 0247_ $$2Handle$$a2128/1015 000049728 0247_ $$2altmetric$$aaltmetric:21814657 000049728 037__ $$aPreJuSER-49728 000049728 041__ $$aeng 000049728 082__ $$a530 000049728 084__ $$2WoS$$aPhysics, Applied 000049728 1001_ $$0P:(DE-HGF)0$$aDarlinski, G.$$b0 000049728 245__ $$aMechanical force sensors using organic thin-film transistors 000049728 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2005 000049728 300__ $$a93708 000049728 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article 000049728 3367_ $$2DataCite$$aOutput Types/Journal article 000049728 3367_ $$00$$2EndNote$$aJournal Article 000049728 3367_ $$2BibTeX$$aARTICLE 000049728 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000049728 3367_ $$2DRIVER$$aarticle 000049728 440_0 $$03051$$aJournal of Applied Physics$$v97$$x0021-8979 000049728 500__ $$aRecord converted from VDB: 12.11.2012 000049728 520__ $$aThe pressure dependence of pentacene (C22H14) transistors with solution-processed polyvinylphenol gate dielectric on glass substrates is investigated by applying uniaxial mechanical pressure with a needle. We found that organic thin-film transistors are sensitive to applied pressure inherently. The measurements reveal a reversible current dependence of the transfer characteristics where the drain current is switching between two states. Experimental and simulation results suggest that switch-on voltage and interface resistance are affected. The change takes seconds, hinting at trap states being responsible for the effect. (C) 2005 American Institute of Physics. 000049728 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$cI01$$x0 000049728 588__ $$aDataset connected to Web of Science 000049728 650_7 $$2WoSType$$aJ 000049728 7001_ $$0P:(DE-HGF)0$$aBottger, U.$$b1 000049728 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$uFZJ 000049728 7001_ $$0P:(DE-HGF)0$$aKlauk, H.$$b3 000049728 7001_ $$0P:(DE-HGF)0$$aHalik, M.$$b4 000049728 7001_ $$0P:(DE-HGF)0$$aZschieschang, U.$$b5 000049728 7001_ $$0P:(DE-HGF)0$$aSchmid, G.$$b6 000049728 7001_ $$0P:(DE-HGF)0$$aDehm, C.$$b7 000049728 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.1888046$$gVol. 97, p. 93708$$p93708$$q97<93708$$tJournal of applied physics$$v97$$x0021-8979$$y2005 000049728 8567_ $$uhttp://hdl.handle.net/2128/1015$$uhttp://dx.doi.org/10.1063/1.1888046 000049728 8564_ $$uhttps://juser.fz-juelich.de/record/49728/files/77774.pdf$$yOpenAccess 000049728 8564_ $$uhttps://juser.fz-juelich.de/record/49728/files/77774.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess 000049728 8564_ $$uhttps://juser.fz-juelich.de/record/49728/files/77774.jpg?subformat=icon-180$$xicon-180$$yOpenAccess 000049728 8564_ $$uhttps://juser.fz-juelich.de/record/49728/files/77774.jpg?subformat=icon-640$$xicon-640$$yOpenAccess 000049728 909CO $$ooai:juser.fz-juelich.de:49728$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire 000049728 9131_ $$0G:(DE-Juel1)FUEK252$$bInformation$$kI01$$lInformationstechnologie mit nanoelektronischen Systemen$$vMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$x0 000049728 9141_ $$y2005 000049728 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed 000049728 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess 000049728 9201_ $$0I:(DE-Juel1)VDB321$$d31.12.2006$$gIFF$$kIFF-IEM$$lElektronische Materialien$$x0 000049728 9201_ $$0I:(DE-Juel1)VDB381$$d14.09.2008$$gCNI$$kCNI$$lCenter of Nanoelectronic Systems for Information Technology$$x1$$z381 000049728 970__ $$aVDB:(DE-Juel1)77774 000049728 980__ $$aVDB 000049728 980__ $$aJUWEL 000049728 980__ $$aConvertedRecord 000049728 980__ $$ajournal 000049728 980__ $$aI:(DE-Juel1)PGI-7-20110106 000049728 980__ $$aI:(DE-Juel1)VDB381 000049728 980__ $$aUNRESTRICTED 000049728 980__ $$aFullTexts 000049728 9801_ $$aFullTexts 000049728 981__ $$aI:(DE-Juel1)PGI-7-20110106 000049728 981__ $$aI:(DE-Juel1)VDB381