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@ARTICLE{Knoch:52768,
author = {Knoch, J. and Mantl, S. and Appenzeller, J.},
title = {{C}omparison of transport properties in carbon nanotube
field-effect transistors with {S}chottky contacts and doped
source/drain contacts},
journal = {Solid state electronics},
volume = {49},
issn = {0038-1101},
address = {Oxford [u.a.]},
publisher = {Pergamon, Elsevier Science},
reportid = {PreJuSER-52768},
pages = {73 - 76},
year = {2005},
note = {Record converted from VDB: 12.11.2012},
abstract = {In this Letter, we present a simulation study of the
electrical characteristics of ultimately scaled carbon
nanotube field-effect transistors. Devices with Schottky
contacts and doped source/drain contacts are compared. We
show that for small bias devices with doped source/drain
contacts exhibit a better on- as well as off-state compared
to devices with Schottky contacts. Both device types,
however, show a poor off-state for larger bias. We will
discuss the relevant transport mechanisms involved and
explain our observations. (C) 2004 Elsevier Ltd. All rights
reserved.},
keywords = {J (WoSType)},
cin = {ISG-1 / CNI},
ddc = {530},
cid = {I:(DE-Juel1)VDB41 / I:(DE-Juel1)VDB381},
pnm = {Materialien, Prozesse und Bauelemente für die Mikro- und
Nanoelektronik},
pid = {G:(DE-Juel1)FUEK252},
shelfmark = {Engineering, Electrical $\&$ Electronic / Physics, Applied
/ Physics, Condensed Matter},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000225719100012},
doi = {10.1016/j.sse.2004.07.002},
url = {https://juser.fz-juelich.de/record/52768},
}