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024 7 _ |2 DOI
|a 10.1002/pssa.200622484
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041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Wensorra, J.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Ohmic contacts for GaAs based nanocolumns
260 _ _ |a Weinheim
|b Wiley-VCH
|c 2006
300 _ _ |a 3559 - 3564
336 7 _ |a Journal Article
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
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440 _ 0 |a Physica Status Solidi A
|x 0031-8965
|0 4913
|y 14
|v 203
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Nonalloyed ohmic contacts with lateral dimensions in the sub-100 nm range have been processed and characterized. The contacts are suitable for the fabrication of GaAs/AlGaAs nanocolumns designed in a 'top down' approach. They are realized on n-type GaAs using a thin low-temperature grown GaAs cap layer and Ti/Au metallization. For the lateral patterning of the nanoscaled ohmic contacts, electron-beam lithography based on Hydrogen Silsesquioxan (HSQ) negative resist is used, followed by sputtering and plasma etching of the metals. The I-V characteristics show ohmic contact behavior and demonstrate the scaling of the proposed contacts down to 50 nm lateral dimension. The specific contact resistance is situated in the range of 1-2 x 10(-5) Omega cm(2). (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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700 1 _ |a Lepsa, M. I.
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700 1 _ |a Indlekofer, K. M.
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700 1 _ |a Förster, A.
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700 1 _ |a Jaschinsky, P.
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700 1 _ |a Voigtländer, B.
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700 1 _ |a Pirug, G.
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|0 P:(DE-Juel1)128784
700 1 _ |a Lüth, H.
|b 7
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773 _ _ |a 10.1002/pssa.200622484
|g Vol. 203, p. 3559 - 3564
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|0 PERI:(DE-600)1481091-8
|t Physica status solidi / A
|v 203
|y 2006
|x 0031-8965
856 7 _ |u http://dx.doi.org/10.1002/pssa.200622484
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914 1 _ |y 2006
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