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024 | 7 | _ | |2 DOI |a 10.1002/pssa.200622484 |
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041 | _ | _ | |a eng |
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084 | _ | _ | |2 WoS |a Materials Science, Multidisciplinary |
084 | _ | _ | |2 WoS |a Physics, Applied |
084 | _ | _ | |2 WoS |a Physics, Condensed Matter |
100 | 1 | _ | |a Wensorra, J. |b 0 |0 P:(DE-HGF)0 |
245 | _ | _ | |a Ohmic contacts for GaAs based nanocolumns |
260 | _ | _ | |a Weinheim |b Wiley-VCH |c 2006 |
300 | _ | _ | |a 3559 - 3564 |
336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
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440 | _ | 0 | |a Physica Status Solidi A |x 0031-8965 |0 4913 |y 14 |v 203 |
500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
520 | _ | _ | |a Nonalloyed ohmic contacts with lateral dimensions in the sub-100 nm range have been processed and characterized. The contacts are suitable for the fabrication of GaAs/AlGaAs nanocolumns designed in a 'top down' approach. They are realized on n-type GaAs using a thin low-temperature grown GaAs cap layer and Ti/Au metallization. For the lateral patterning of the nanoscaled ohmic contacts, electron-beam lithography based on Hydrogen Silsesquioxan (HSQ) negative resist is used, followed by sputtering and plasma etching of the metals. The I-V characteristics show ohmic contact behavior and demonstrate the scaling of the proposed contacts down to 50 nm lateral dimension. The specific contact resistance is situated in the range of 1-2 x 10(-5) Omega cm(2). (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
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700 | 1 | _ | |a Förster, A. |b 3 |0 P:(DE-HGF)0 |
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700 | 1 | _ | |a Voigtländer, B. |b 5 |u FZJ |0 P:(DE-Juel1)VDB5601 |
700 | 1 | _ | |a Pirug, G. |b 6 |u FZJ |0 P:(DE-Juel1)128784 |
700 | 1 | _ | |a Lüth, H. |b 7 |u FZJ |0 P:(DE-Juel1)VDB975 |
773 | _ | _ | |a 10.1002/pssa.200622484 |g Vol. 203, p. 3559 - 3564 |p 3559 - 3564 |q 203<3559 - 3564 |0 PERI:(DE-600)1481091-8 |t Physica status solidi / A |v 203 |y 2006 |x 0031-8965 |
856 | 7 | _ | |u http://dx.doi.org/10.1002/pssa.200622484 |
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914 | 1 | _ | |y 2006 |
915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
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