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@ARTICLE{Jeong:53409,
author = {Jeong, D. S. and Schroeder, H. and Waser, R.},
title = {{I}mpedance spectroscopy of {T}i{O}2 thin film showing
resistive switching},
journal = {Applied physics letters},
volume = {89},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-53409},
pages = {082909},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {Impedance characteristics of 27 nm thick anatase TiO2 films
showing bistable resistive switching were investigated in
the frequency domain (100 Hz-10 MHz) in various resistance
states, a fresh state (before electroforming), a high
resistive state (HRS), and a low resistive state (LRS). dc
conductance in the film becomes dominent in HRS and LRS and
the capacitances in the various states are almost identical.
Numerical calculations using finite element analysis were
performed for the localized filament and homogeneous model,
whose results suggest that the filament model is consistent
with the experimental results. (c) 2006 American Institute
of Physics.},
keywords = {J (WoSType)},
cin = {CNI / IFF-IEM / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB381 / I:(DE-Juel1)VDB321 /
$I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000240035400081},
doi = {10.1063/1.2336621},
url = {https://juser.fz-juelich.de/record/53409},
}