TY  - JOUR
AU  - Weides, M.
TI  - Josephson Junctions with Centred Step and Local Variation of Critical Current Density
JO  - IEEE transactions on applied superconductivity
VL  - 19
SN  - 1051-8223
CY  - New York, NY
PB  - IEEE
M1  - PreJuSER-5451
SP  - 689 - 692
PY  - 2009
N1  - Record converted from VDB: 12.11.2012
AB  - Superconductor-insulator-ferromagnet-superconductor (SIFS) Josephson tunnel junctions based on Nb/Al2O3/NiCu/Nb stacks with a thickness step in the metallic NiCu interlayer were fabricated. The step height of a few 0.1 nm was defined by optical lithography and controlled etching of both Nb and NiCu layers. Experimentally determined junction parameters by current-voltage characteristics and Fraunhofer pattern indicate a uniform NiCu thickness and similar interface transparencies for etched and non-etched parts. The critical current diffraction pattern was calculated and measured for stepped junctions having the same ground phase difference but different critical current densities in both halves. The measured data show a good agreement with simulations.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000268282000130
DO  - DOI:10.1109/TASC.2009.2019049
UR  - https://juser.fz-juelich.de/record/5451
ER  -