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@ARTICLE{Mahalingam:57838,
      author       = {Mahalingam, K. and Eyink, K. G. and Brown, G. J. and
                      Dorsey, D. L. and Kisielowski, C. F. and Thust, A.},
      title        = {{Q}uantifying stoichiometry of mixed-cation-anion {III}-{V}
                      semiconductor interfaces at atomic resolution},
      journal      = {Applied physics letters},
      volume       = {88},
      issn         = {0003-6951},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-57838},
      pages        = {091904},
      year         = {2006},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Employing the focal-series reconstruction technique in
                      high-resolution transmission electron microscopy, we
                      obtained true atomic resolution images of interfacial
                      disorder within cation and anion sublattices across
                      interfaces in an InGaSb/InAs heterostructure. This enabled
                      independent quantitative mapping of changes in the In-Ga and
                      As-Sb contents across interfacial regions similar to 0.6 nm
                      in width. A comparison of the cation and anion sublattice
                      images revealed that intermixing at the InGaSb-on-InAs
                      interface is confined to the In-Ga sublattice. Also, atomic
                      scale roughness within the As-Sb sublattice of the
                      InAs-on-InGaSb interface was discerned. This approach is
                      general, permitting atomic-scale compositional analysis of
                      heterointerfaces with two species per sublattice. (c) 2006
                      American Institute of Physics.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IMF},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB37},
      pnm          = {Kondensierte Materie},
      pid          = {G:(DE-Juel1)FUEK414},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000235736300028},
      doi          = {10.1063/1.2178771},
      url          = {https://juser.fz-juelich.de/record/57838},
}