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@INPROCEEDINGS{Saleh:60113,
      author       = {Saleh, R. and Munisa, L. and Beyer, W.},
      title        = {{M}icrostructure characterization of amorphous silicon
                      carbon (a-{S}i:{C}:{H}) films by hydrogen effusion and
                      diffusion measurements},
      reportid     = {PreJuSER-60113},
      year         = {2000},
      note         = {Record converted from VDB: 12.11.2012},
      comment      = {International Symposium on the Science on Surfaces and
                      Nanostructures (ISSSN)},
      booktitle     = {International Symposium on the Science
                       on Surfaces and Nanostructures (ISSSN)},
      month         = {Nov},
      date          = {2000-11-22},
      organization  = {Singapore, 22 Nov 2000},
      cin          = {IPV},
      cid          = {I:(DE-Juel1)VDB46},
      pnm          = {Grundlagen und Technologie von Dünnschichtsolarzellen},
      pid          = {G:(DE-Juel1)FUEK281},
      typ          = {PUB:(DE-HGF)24},
      url          = {https://juser.fz-juelich.de/record/60113},
}