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Microstructure characterization of amorphous silicon carbon (a-Si:C:H) films by hydrogen effusion and diffusion measurements

 ;  ;

2000

International Symposium on the Science on Surfaces and Nanostructures (ISSSN)
Seminar, SingaporeSingapore, 22 Nov 20002000-11-22


Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
  1. Institut für Photovoltaik (IPV)
Research Program(s):
  1. Grundlagen und Technologie von Dünnschichtsolarzellen (29.90.0)

Appears in the scientific report 2000
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The record appears in these collections:
Document types > Presentations > Poster
Institute Collections > IMD > IMD-3
Workflow collections > Public records
IEK > IEK-5
Publications database
 Record created 2012-11-13, last modified 2024-07-08
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