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| Home > Publications database > Near-field study of optical modes in randomly textured ZnO thin films |
| Journal Article | PreJuSER-61534 |
;
2007
Elsevier Science, Academic Press
Oxford [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.spmi.2007.04.002
Abstract: We report on near-field scanning optical microscopy measurements on randomly textured ZnO thin films. These films are commonly used as transparent conducting oxide in thin-film solar cells. Textured interfaces are used to increase the scattering of light, which leads to a better light trapping in the solar cell. Here, both the topography and the local transmission are measured with a tapered fiber tip with very high spatial resolution. By varying the distance of the tip and the wavelength of the incident light, the optical profile is visualized and reveals a strong confinement of light on a subwavelength scale which corresponds to ridges in the surface structure. The confinement of light results from guided optical modes in the ZnO which are accompanied by a modulated evanescent field in air. No corresponding structure to this modulation is found in the topography. These results give new insight for further improvement of light trapping in solar cells. (c) 2007 Elsevier Ltd. All rights reserved.
Keyword(s): J ; near-field microscopy (auto) ; thin-film solar cell (auto) ; ZnO (auto) ; random surface (auto) ; light trapping (auto)
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