TY  - JOUR
AU  - Strachan, J.P.
AU  - Yang, J.J.
AU  - Münstermann, R.
AU  - Scholl, A.
AU  - Medeiros-Ribeiro, G.
AU  - Stewart, D.R.
AU  - Williams, R.S.
TI  - Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS
JO  - Nanotechnology
VL  - 20
SN  - 0957-4484
CY  - Bristol
PB  - IOP Publ.
M1  - PreJuSER-6185
SP  - 485701
PY  - 2009
N1  - We thank J Borghetti, X Li, P Long, D A A Ohlberg, M D Pickett, Q Xia and W Wu for experimental assistance and P J Kuekes, D B Strukov and W M Tong for helpful discussions. The ALS is funded by the US Department of Energy's Office of Basic Energy Sciences and work at HP is sponsored by the US Government's Nano-Enabled Technology Initiative.
AB  - We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
C6  - pmid:19880979
UR  - <Go to ISI:>//WOS:000271471300013
DO  - DOI:10.1088/0957-4484/20/48/485701
UR  - https://juser.fz-juelich.de/record/6185
ER  -