Journal Article

PreJuSER-6185

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS

Strachan, J. P. ; Yang, J. J. ; Münstermann, R.FZJ* ; Scholl, A. ; Medeiros-Ribeiro, G. ; Stewart, D. R. ; Williams, R. S.

2009
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/0957-4484/20/48/485701

Abstract: We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.

Keyword(s): J

Note: We thank J Borghetti, X Li, P Long, D A A Ohlberg, M D Pickett, Q Xia and W Wu for experimental assistance and P J Kuekes, D B Strukov and W M Tong for helpful discussions. The ALS is funded by the US Department of Energy's Office of Basic Energy Sciences and work at HP is sponsored by the US Government's Nano-Enabled Technology Initiative.

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Contributing Institute(s):

1. Elektronische Materialien (IFF-6)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2009

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