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001     6185
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024 7 _ |2 pmid
|a pmid:19880979
024 7 _ |2 DOI
|a 10.1088/0957-4484/20/48/485701
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037 _ _ |a PreJuSER-6185
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Nanoscience & Nanotechnology
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Strachan, J.P.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS
260 _ _ |a Bristol
|b IOP Publ.
|c 2009
300 _ _ |a 485701
336 7 _ |a Journal Article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
|2 DRIVER
440 _ 0 |a Nanotechnology
|x 0957-4484
|0 4475
|v 20
500 _ _ |a We thank J Borghetti, X Li, P Long, D A A Ohlberg, M D Pickett, Q Xia and W Wu for experimental assistance and P J Kuekes, D B Strukov and W M Tong for helpful discussions. The ALS is funded by the US Department of Energy's Office of Basic Energy Sciences and work at HP is sponsored by the US Government's Nano-Enabled Technology Initiative.
520 _ _ |a We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.
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700 1 _ |a Yang, J.J.
|b 1
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700 1 _ |a Münstermann, R.
|b 2
|u FZJ
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700 1 _ |a Scholl, A.
|b 3
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700 1 _ |a Medeiros-Ribeiro, G.
|b 4
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700 1 _ |a Stewart, D.R.
|b 5
|0 P:(DE-HGF)0
700 1 _ |a Williams, R.S.
|b 6
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773 _ _ |a 10.1088/0957-4484/20/48/485701
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|t Nanotechnology
|v 20
|y 2009
|x 0957-4484
856 7 _ |u http://dx.doi.org/10.1088/0957-4484/20/48/485701
909 C O |o oai:juser.fz-juelich.de:6185
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914 1 _ |y 2009
915 _ _ |0 StatID:(DE-HGF)0010
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920 1 _ |d 31.12.2010
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