Journal Article

PreJuSER-61923

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Band structure information and resonant inelastic soft X-ray scattering in broad band solids

Eisebitt, S.FZJ* ; Eberhardt, W.FZJ*

2000
Elsevier New York, NY [u.a.]

This record in other databases:

Abstract: We review the current status of resonant inelastic soft X-ray scattering in broad band solids. In particular, the opportunities and limitations of this technique in order to obtain band structure information are discussed and compared to the well established technique of angle resolved photoemission. (C) 2000 Elsevier Science B.V. All rights reserved.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Festkörperforschung (IFF)

Research Program(s):

1. Elektronische Struktur von Festkörpern, Oberflächen und Schichtsystemen (23.20.0)

Appears in the scientific report 2000

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