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@ARTICLE{Szade:6489,
      author       = {Szade, J. and Psiuk, B. and Pilch, M. and Waser, R. and
                      Szot, K.},
      title        = {{S}elf-neutralization via electroreduction in photoemission
                      from {S}r{T}i{O}3 single crystals},
      journal      = {Applied physics / A},
      volume       = {97},
      issn         = {0947-8396},
      address      = {Berlin},
      publisher    = {Springer},
      reportid     = {PreJuSER-6489},
      pages        = {449 - 454},
      year         = {2009},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The effect of bulk mediated neutralization in photoemission
                      from insulating monocrystalline SrTiO3 was studied.
                      Long-term measurements of the photoemission line shift and
                      emission current allowed us to relate the observed
                      systematic reduction of the surface charging to increasing
                      conductivity of the samples. The bulk resistance of the
                      SrTiO3 samples was found to scale with their thickness. We
                      present a model of the observed behaviour based on
                      well-conducting filaments connecting the surface with the
                      grounded sample holder, similar to the hypothesis explaining
                      resistive switching in single crystals and thin films of
                      SrTiO3. In our model the changes of the local oxygen
                      stoichiometry are driven by surface potential and
                      consequently electric field and chemical gradients, which
                      cause electroreduction and electromigration along extended
                      defects in the crystals.},
      keywords     = {J (WoSType)},
      cin          = {IFF-6 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Materials Science, Multidisciplinary / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000269844400029},
      doi          = {10.1007/s00339-009-5240-0},
      url          = {https://juser.fz-juelich.de/record/6489},
}