Book/Dissertation / PhD Thesis

FZJ-2016-02159

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Bulk and surface sensitive energy-filtered photoemission microscopy using synchrotron radiation for the study of resistive switching memories

Patt, M. C. (Corresponding author)FZJ*

2016
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag Jülich
ISBN: 978-3-95806-130-9

Please use a persistent id in citations: http://hdl.handle.net/2128/10192

Abstract: In this thesis the applicability of energy-filtered photoemission microscopy for the analysis of future electronic devices for the information technology is studied. The long-term perspective is the analysis of the switching-dynamics in oxide-based nonvolatile resistive memories. These are regarded as promising new components in the development of more powerful processing units or storage devices, since the improvements of the classical silicon or magnetism-based technologies are approaching their physical limits. Nevertheless, the efficiency and functionality of suitable material systems strongly depend on the quality and properties of their surfaces and interfaces. The energy-filtered photoemission microscopy provides a spatially resolved chemical study of these systems, especially in combination with high brilliance synchrotron light sources. The high photon intensities are needed, if characteristic core levels of a specimen should be analyzed with a high spatial and energy resolution. Studies of metal-insulator-metal structures based on the valence change effect in strontium titanate, which is a model system for resistive switching devices, showed that the spatial resolution needs to be in the 100 nm regime and the energy-resolution in the 100 meV regime to resolve the relevant changes in a switching cycle. Therefore, a big focus of this thesis lies on the determination of the relevant experimental parameters which are needed to fulfill these requirements. Another challenging task is to study the functional layer of such a device through a capping electrode. Hard X-ray synchrotron radiation allows the use of high kinetic energy photoelectrons with an up to ten times lager information depth. In this thesis it is shown for the first time, which spatial resolution can be achieved when detecting chemically different regions through cover layer thicknesses of up to 15 nm. Microscope-relevant topics like transmission and aberration effects are discussed with respect to the use of high kinetic electrons and illustrated by calculations.

Note: Universität Duisburg, Diss., 2016

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)

Appears in the scientific report 2016

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Database coverage:
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