001     808641
005     20210129222810.0
024 7 _ |2 doi
|a 10.1364/OE.23.025487
024 7 _ |2 Handle
|a 2128/10752
024 7 _ |a WOS:000365077900008
|2 WOS
037 _ _ |a FZJ-2016-02283
082 _ _ |a 530
100 1 _ |0 P:(DE-HGF)0
|a Kunkemöller, Georg
|b 0
|e Corresponding author
245 _ _ |a Extreme ultraviolet proximity lithography for fast, flexible and parallel fabrication of infrared antennas
260 _ _ |a Washington, DC
|b Soc.
|c 2015
336 7 _ |2 DRIVER
|a article
336 7 _ |2 DataCite
|a Output Types/Journal article
336 7 _ |0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
|a Journal Article
|b journal
|m journal
|s 1460969246_13869
336 7 _ |2 BibTeX
|a ARTICLE
336 7 _ |2 ORCID
|a JOURNAL_ARTICLE
336 7 _ |0 0
|2 EndNote
|a Journal Article
520 _ _ |a We present a method for fabrication of large arrays of nano-antennas using extreme-ultraviolet (EUV) illumination. A discharge-produced plasma source generating EUV radiation around 10.88 nm wavelength is used for the illumination of a photoresist via a mask in a proximity printing setup. The method of metallic nanoantennas fabrication utilizes a bilayer photoresist and employs a lift-off process. The impact of Fresnel-diffraction of EUV light in the mask on a shape of the nanostructures has been investigated. It is shown how by the use of the same rectangular apertures in the transmission mask, antennas of various shapes can be fabricated. Using Fourier transform infrared spectroscopy, spectra of antennas reflectivity were measured and compared to FDTD simulations demonstrating good agreement.
536 _ _ |0 G:(DE-HGF)POF3-521
|a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
|c POF3-521
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |0 P:(DE-HGF)0
|a Maß, Tobias W. W.
|b 1
700 1 _ |0 P:(DE-HGF)0
|a Michel, Ann-Katrin U.
|b 2
700 1 _ |0 P:(DE-HGF)0
|a Kim, Hyun-Su
|b 3
700 1 _ |0 P:(DE-HGF)0
|a Brose, Sascha
|b 4
700 1 _ |0 P:(DE-HGF)0
|a Danylyuk, Serhiy
|b 5
700 1 _ |0 P:(DE-HGF)0
|a Taubner, Thomas
|b 6
700 1 _ |0 P:(DE-Juel1)157957
|a Juschkin, Larissa
|b 7
|e Corresponding author
773 _ _ |0 PERI:(DE-600)1491859-6
|a 10.1364/OE.23.025487
|g Vol. 23, no. 20, p. 25487 -
|n 20
|p 25487 -
|t Optics express
|v 23
|x 1094-4087
|y 2015
856 4 _ |u https://juser.fz-juelich.de/record/808641/files/oe-23-20-25487-2.pdf
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/808641/files/oe-23-20-25487-2.gif?subformat=icon
|x icon
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/808641/files/oe-23-20-25487-2.jpg?subformat=icon-180
|x icon-180
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/808641/files/oe-23-20-25487-2.jpg?subformat=icon-700
|x icon-700
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/808641/files/oe-23-20-25487-2.pdf?subformat=pdfa
|x pdfa
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:808641
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)157957
|a Forschungszentrum Jülich GmbH
|b 7
|k FZJ
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)157957
|a Forschungszentrum Jülich GmbH
|b 7
|k FZJ
913 1 _ |0 G:(DE-HGF)POF3-521
|1 G:(DE-HGF)POF3-520
|2 G:(DE-HGF)POF3-500
|a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2016
915 _ _ |0 StatID:(DE-HGF)0200
|2 StatID
|a DBCoverage
|b SCOPUS
915 _ _ |0 StatID:(DE-HGF)0300
|2 StatID
|a DBCoverage
|b Medline
915 _ _ |0 StatID:(DE-HGF)0100
|2 StatID
|a JCR
|b OPT EXPRESS : 2014
915 _ _ |0 StatID:(DE-HGF)0150
|2 StatID
|a DBCoverage
|b Web of Science Core Collection
915 _ _ |0 StatID:(DE-HGF)0110
|2 StatID
|a WoS
|b Science Citation Index
915 _ _ |0 StatID:(DE-HGF)0500
|2 StatID
|a DBCoverage
|b DOAJ
915 _ _ |0 StatID:(DE-HGF)9900
|2 StatID
|a IF < 5
915 _ _ |0 StatID:(DE-HGF)0510
|2 StatID
|a OpenAccess
915 _ _ |0 StatID:(DE-HGF)1150
|2 StatID
|a DBCoverage
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |0 StatID:(DE-HGF)0111
|2 StatID
|a WoS
|b Science Citation Index Expanded
915 _ _ |0 StatID:(DE-HGF)0199
|2 StatID
|a DBCoverage
|b Thomson Reuters Master Journal List
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-9-20110106
|k PGI-9
|l Halbleiter-Nanoelektronik
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 1
920 1 _ |0 I:(DE-588b)36225-6
|k RWTH
|l Rheinisch-Westfälische Technische Hochschule
|x 2
980 1 _ |a UNRESTRICTED
980 1 _ |a FullTexts
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-9-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 _ _ |a I:(DE-588b)36225-6


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
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