000809100 001__ 809100
000809100 005__ 20210129222938.0
000809100 037__ $$aFZJ-2016-02497
000809100 1001_ $$0P:(DE-HGF)0$$aSchie, M.$$b0
000809100 1112_ $$aEuropean Materials Research Society meeting$$cLille$$d2016-05-02 - 2016-05-06$$wFrance
000809100 245__ $$aIon Migration in Amorphous HfOx
000809100 260__ $$c2016
000809100 3367_ $$033$$2EndNote$$aConference Paper
000809100 3367_ $$2BibTeX$$aINPROCEEDINGS
000809100 3367_ $$2DRIVER$$aconferenceObject
000809100 3367_ $$2ORCID$$aCONFERENCE_POSTER
000809100 3367_ $$2DataCite$$aOutput Types/Conference Poster
000809100 3367_ $$0PUB:(DE-HGF)24$$2PUB:(DE-HGF)$$aPoster$$bposter$$mposter$$s1462957709_5386$$xOther
000809100 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000809100 7001_ $$0P:(DE-HGF)0$$aSalinga, M.$$b1
000809100 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$ufzj
000809100 7001_ $$0P:(DE-HGF)0$$aDe Souza, R. A.$$b3
000809100 909CO $$ooai:juser.fz-juelich.de:809100$$pVDB
000809100 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich$$b2$$kFZJ
000809100 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000809100 9141_ $$y2016
000809100 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000809100 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000809100 980__ $$aposter
000809100 980__ $$aVDB
000809100 980__ $$aUNRESTRICTED
000809100 980__ $$aI:(DE-Juel1)PGI-7-20110106