TY  - JOUR
AU  - Voigtländer, Bert
AU  - Cherepanov, Vasily
AU  - Coenen, Peter
TI  - The Multimeter at the Nanoscale
JO  - Vakuum in Forschung und Praxis
VL  - 28
IS  - 3
SN  - 0947-076X
CY  - Weinheim
PB  - Wiley-VCH
M1  - FZJ-2016-03491
SP  - 38 - 42
PY  - 2016
AB  - A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale. We demonstrate the capabilities of the instrument by measuring resistance profiles along freestanding GaAs nanowires, by the acquisition of nanoscale potential maps, and by the identification of an anisotropy in the surface conductivity at a silicon surface.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000385939600017
DO  - DOI:10.1002/vipr.201600605
UR  - https://juser.fz-juelich.de/record/810925
ER  -