Journal Article

FZJ-2016-03491

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png The Multimeter at the Nanoscale

Voigtländer, B. (Corresponding author)FZJ* ; Cherepanov, V.FZJ* ; Coenen, P.

2016
Wiley-VCH Weinheim

This record in other databases:  

Please use a persistent id in citations: doi:10.1002/vipr.201600605

Abstract: A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale. We demonstrate the capabilities of the instrument by measuring resistance profiles along freestanding GaAs nanowires, by the acquisition of nanoscale potential maps, and by the identification of an anisotropy in the surface conductivity at a silicon surface.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)

Research Program(s):

1. 142 - Controlling Spin-Based Phenomena (POF3-142) (POF3-142)

Appears in the scientific report 2016

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Database coverage:
Nationallizenz ; No Authors Fulltext ; SCOPUS

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