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005     20210129223630.0
024 7 _ |a 10.1002/vipr.201600605
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024 7 _ |a 0947-076X
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024 7 _ |a 1522-2454
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037 _ _ |a FZJ-2016-03491
082 _ _ |a 530
100 1 _ |a Voigtländer, Bert
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245 _ _ |a The Multimeter at the Nanoscale
260 _ _ |a Weinheim
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520 _ _ |a A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale. We demonstrate the capabilities of the instrument by measuring resistance profiles along freestanding GaAs nanowires, by the acquisition of nanoscale potential maps, and by the identification of an anisotropy in the surface conductivity at a silicon surface.
536 _ _ |a 142 - Controlling Spin-Based Phenomena (POF3-142)
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700 1 _ |a Cherepanov, Vasily
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700 1 _ |a Coenen, Peter
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773 _ _ |a 10.1002/vipr.201600605
|g Vol. 28, no. 3, p. 38 - 42
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|p 38 - 42
|t Vakuum in Forschung und Praxis
|v 28
|y 2016
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