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@ARTICLE{Strangio:821136,
author = {Strangio, Sebastiano and Palestri, Pierpaolo and Esseni,
DAVID and Selmi, Luca and Crupi, Felice and Richter, Simon
and Zhao, Qing-Tai and Mantl, Siegfried},
title = {{I}mpact of {TFET} {U}nidirectionality and {A}mbipolarity
on the {P}erformance of 6{T} {SRAM} {C}ells},
journal = {IEEE journal of the Electron Devices Society},
volume = {3},
number = {3},
issn = {2168-6734},
address = {[New York, NY]},
publisher = {IEEE},
reportid = {FZJ-2016-06379},
pages = {223 - 232},
year = {2015},
abstract = {We use mixed device-circuit simulations to predict the
performance of 6T static RAM (SRAM) cells implemented with
tunnel-FETs (TFETs). Idealized template devices are used to
assess the impact of device unidirectionality, which is
inherent to TFETs and identify the most promising
configuration for the access transistors. The same template
devices are used to investigate the VDD range, where TFETs
may be advantageous compared to conventional CMOS. The
impact of device ambipolarity on SRAM operation is also
analyzed. Realistic device templates extracted from
experimental data of fabricated state-of-the-art silicon
pTFET are then used to estimate the performance gap between
the simulation of idealized TFETs and the best experimental
implementations.},
cin = {PGI-9 / JARA-FIT},
ddc = {620},
cid = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000369884400020},
doi = {10.1109/JEDS.2015.2392793},
url = {https://juser.fz-juelich.de/record/821136},
}