TY  - JOUR
AU  - Tsuruoka, Tohru
AU  - Valov, Ilia
AU  - Mannequin, Cedric
AU  - Hasegawa, Tsuyoshi
AU  - Waser, R.
AU  - Aono, Masakazu
TI  - Humidity effects on the redox reactions and ionic transport in a Cu/Ta$_{2}$ O$_{5}$ /Pt atomic switch structure
JO  - Japanese journal of applied physics
VL  - 55
IS  - 6S1
SN  - 1347-4065
CY  - Bristol
PB  - IOP Publ.
M1  - FZJ-2016-07036
SP  - 06GJ09 -
PY  - 2016
AB  - Redox reactions at the Cu/Ta$_{2}$ O$_{5}$ interface and subsequent Cu ion transport in a Ta2O5 film have been investigated by means of cyclic voltammetry (CV) measurements. Under positive bias to the Cu electrode, Cu is preferentially oxidized to Cu2+ and then to Cu+. Subsequent negative bias causes a reduction of the oxidized Cu ions at the interface. It was found that CV curves change drastically with varied relative humidity levels from 5 to 85%. At higher humidity levels, the ion concentrations and diffusion coefficients, estimated from the CV curves, suggest increased redox reaction rates and a significant contribution of proton conduction to the ionic transport. The results indicate that the redox reactions of moisture are rate-limiting and highlight the importance of water uptake by the matrix oxide film in understanding and controlling the resistive switching behavior of oxide-based atomic switches.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000377484100050
DO  - DOI:10.7567/JJAP.55.06GJ09
UR  - https://juser.fz-juelich.de/record/824447
ER  -