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@ARTICLE{Tsuruoka:824447,
      author       = {Tsuruoka, Tohru and Valov, Ilia and Mannequin, Cedric and
                      Hasegawa, Tsuyoshi and Waser, R. and Aono, Masakazu},
      title        = {{H}umidity effects on the redox reactions and ionic
                      transport in a {C}u/{T}a$_{2}$ {O}$_{5}$ /{P}t atomic switch
                      structure},
      journal      = {Japanese journal of applied physics},
      volume       = {55},
      number       = {6S1},
      issn         = {1347-4065},
      address      = {Bristol},
      publisher    = {IOP Publ.},
      reportid     = {FZJ-2016-07036},
      pages        = {06GJ09 -},
      year         = {2016},
      abstract     = {Redox reactions at the Cu/Ta$_{2}$ O$_{5}$ interface and
                      subsequent Cu ion transport in a Ta2O5 film have been
                      investigated by means of cyclic voltammetry (CV)
                      measurements. Under positive bias to the Cu electrode, Cu is
                      preferentially oxidized to Cu2+ and then to Cu+. Subsequent
                      negative bias causes a reduction of the oxidized Cu ions at
                      the interface. It was found that CV curves change
                      drastically with varied relative humidity levels from 5 to
                      85\%. At higher humidity levels, the ion concentrations and
                      diffusion coefficients, estimated from the CV curves,
                      suggest increased redox reaction rates and a significant
                      contribution of proton conduction to the ionic transport.
                      The results indicate that the redox reactions of moisture
                      are rate-limiting and highlight the importance of water
                      uptake by the matrix oxide film in understanding and
                      controlling the resistive switching behavior of oxide-based
                      atomic switches.},
      cin          = {PGI-7},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000377484100050},
      doi          = {10.7567/JJAP.55.06GJ09},
      url          = {https://juser.fz-juelich.de/record/824447},
}