Journal Article

FZJ-2016-07463

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png High-performance CuFe$_{2}$ O$_{4}$ epitaxial thin films with enhanced ferromagnetic resonance properties

Zhang, R. ; Liu, M. (Corresponding author) ; Lu, L.FZJ* ; Mi, S.-B. ; Jia, C.-L.FZJ* ; Wang, H. (Corresponding author)

2016
RSC Publishing London

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Please use a persistent id in citations: doi:10.1039/C6RA22016A

Abstract: Highly epitaxial thin films of copper ferrite (CuFe2O4) have been fabricated on MgAl2O4 (001) substrates at a growth temperature of 400 °C for the first time, we believe, through a radio-frequency sputtering method. Structural analyses through high-resolution X-ray diffraction (HRXRD), Raman spectroscopy, and high-resolution transmission electron microscopy (HRTEM) all confirm the tetragonal spinel phase of CuFe2O4 epitaxial film and high tetragonal distortion (c/a = 1.08) of its unit cells. The 50 nm-thick T-CuFe2O4 epitaxial film shows unique soft magnetism with small coercivity of 23 Oe and decreased magnetization. However, a superior ferromagnetic linewidth of only ∼93 Oe in the post-annealed T-CuFe2O4 film compared with a linewidth of ∼1500 Oe in T-CuFe2O4 single crystal bulk material is also observed, which indicates that epitaxial growth of oxide thin films combined with proper heat-treatment-induced cation engineering can impose novel functionalities.

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; No Authors Fulltext ; SCOPUS ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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