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| Home > Publications database > Intrinsic electronic properties of high-quality wurtzite InN > print |
| 001 | 825437 | ||
| 005 | 20240610120307.0 | ||
| 024 | 7 | _ | |a 10.1103/PhysRevB.94.245201 |2 doi |
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| 024 | 7 | _ | |a 2469-9950 |2 ISSN |
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| 037 | _ | _ | |a FZJ-2016-07900 |
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| 100 | 1 | _ | |a Eisele, H. |0 P:(DE-HGF)0 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Intrinsic electronic properties of high-quality wurtzite InN |
| 260 | _ | _ | |a Woodbury, NY |c 2016 |b Inst. |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 520 | _ | _ | |a Recent reports suggested that InN is a highly unusual III-V semiconductor, whose behavior fundamentally differs from that of others. We therefore analyzed its intrinsic electronic properties on the highest available quality InN layers, demonstrating the absence of electron accumulation at the (101¯0) cleavage surface and in the bulk. The bulk electron density is governed solely by dopants. Hence, we conclude that InN acts similarly to the other III-V semiconductors and previously reported intriguing effects are related to low crystallinity, surface decomposition, nonstoichiometry, and/or In adlayers. |
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| 773 | 1 | 8 | |a 10.1103/physrevb.94.245201 |b American Physical Society (APS) |d 2016-12-16 |n 24 |p 245201 |3 journal-article |2 Crossref |t Physical Review B |v 94 |y 2016 |x 2469-9950 |
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