Contribution to a conference proceedings/Contribution to a book FZJ-2017-00559

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KMC simulation of the electroforming, set and reset processes in redox-based resistive switching devices

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2016
IEEE


2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), NurembergNuremberg, Germany, 6 Sep 2016 - 8 Sep 20162016-09-062016-09-08
IEEE 141 pp. () [10.1109/SISPAD.2016.7605167]

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Note: ISBN 978-1-5090-0818-6

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
Research Program(s):
  1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2016
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Document types > Books > Contribution to a book
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 Record created 2017-01-17, last modified 2021-01-29


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