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| 001 | 826326 | ||
| 005 | 20210129225601.0 | ||
| 024 | 7 | _ | |a 10.1109/SISPAD.2016.7605167 |2 doi |
| 037 | _ | _ | |a FZJ-2017-00559 |
| 100 | 1 | _ | |a Abbaspour, Elhameh |0 P:(DE-HGF)0 |b 0 |
| 111 | 2 | _ | |a 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |c Nuremberg |d 2016-09-06 - 2016-09-08 |w Germany |
| 245 | _ | _ | |a KMC simulation of the electroforming, set and reset processes in redox-based resistive switching devices |
| 260 | _ | _ | |c 2016 |b IEEE |
| 295 | 1 | 0 | |a |
| 300 | _ | _ | |a 141 |
| 336 | 7 | _ | |a CONFERENCE_PAPER |2 ORCID |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
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| 336 | 7 | _ | |a Contribution to a conference proceedings |b contrib |m contrib |0 PUB:(DE-HGF)8 |s 1484724166_22330 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Contribution to a book |0 PUB:(DE-HGF)7 |2 PUB:(DE-HGF) |m contb |
| 500 | _ | _ | |a ISBN 978-1-5090-0818-6 |
| 536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
| 588 | _ | _ | |a Dataset connected to CrossRef Conference |
| 700 | 1 | _ | |a Menzel, Stephan |0 P:(DE-Juel1)158062 |b 1 |u fzj |
| 700 | 1 | _ | |a Jungemann, Christoph |0 P:(DE-HGF)0 |b 2 |
| 773 | _ | _ | |a 10.1109/SISPAD.2016.7605167 |
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| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-Juel1)158062 |
| 913 | 1 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-521 |2 G:(DE-HGF)POF3-500 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
| 914 | 1 | _ | |y 2016 |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-7-20110106 |k PGI-7 |l Elektronische Materialien |x 0 |
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