TY  - CONF
AU  - Abbaspour, Elhameh
AU  - Menzel, Stephan
AU  - Jungemann, Christoph
TI  - KMC simulation of the electroforming, set and reset processes in redox-based resistive switching devices
PB  - IEEE
M1  - FZJ-2017-00559
SP  - 141
PY  - 2016
N1  - ISBN 978-1-5090-0818-6
T2  - 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
CY  - 6 Sep 2016 - 8 Sep 2016, Nuremberg (Germany)
Y2  - 6 Sep 2016 - 8 Sep 2016
M2  - Nuremberg, Germany
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
DO  - DOI:10.1109/SISPAD.2016.7605167
UR  - https://juser.fz-juelich.de/record/826326
ER  -