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| 001 | 826344 | ||
| 005 | 20210129225602.0 | ||
| 037 | _ | _ | |a FZJ-2017-00572 |
| 100 | 1 | _ | |0 P:(DE-HGF)0 |a La Torre, C. |b 0 |
| 111 | 2 | _ | |a Materials Research Society Fall Meeting |c Boston |d 2016-11-27 - 2016-12-02 |w USA |
| 245 | _ | _ | |a Analysis of the Two-Part SET Switching Process in STO-based ReRAM |
| 260 | _ | _ | |c 2016 |
| 336 | 7 | _ | |0 33 |2 EndNote |a Conference Paper |
| 336 | 7 | _ | |2 DataCite |a Other |
| 336 | 7 | _ | |2 BibTeX |a INPROCEEDINGS |
| 336 | 7 | _ | |2 DRIVER |a conferenceObject |
| 336 | 7 | _ | |2 ORCID |a LECTURE_SPEECH |
| 336 | 7 | _ | |0 PUB:(DE-HGF)6 |2 PUB:(DE-HGF) |a Conference Presentation |b conf |m conf |s 1484753075_22334 |x Other |
| 536 | _ | _ | |0 G:(DE-HGF)POF3-521 |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |c POF3-521 |f POF III |x 0 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Fleck, K. |b 1 |
| 700 | 1 | _ | |0 P:(DE-Juel1)140489 |a Aslam, Nabeel |b 2 |
| 700 | 1 | _ | |0 P:(DE-Juel1)130717 |a Hoffmann-Eifert, Susanne |b 3 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Böttger, U. |b 4 |
| 700 | 1 | _ | |0 P:(DE-Juel1)131022 |a Waser, R. |b 5 |u fzj |
| 700 | 1 | _ | |0 P:(DE-Juel1)158062 |a Menzel, Stephan |b 6 |u fzj |
| 909 | C | O | |o oai:juser.fz-juelich.de:826344 |p VDB |
| 910 | 1 | _ | |0 I:(DE-588b)5008462-8 |6 P:(DE-Juel1)131022 |a Forschungszentrum Jülich |b 5 |k FZJ |
| 910 | 1 | _ | |0 I:(DE-588b)5008462-8 |6 P:(DE-Juel1)158062 |a Forschungszentrum Jülich |b 6 |k FZJ |
| 910 | 1 | _ | |0 I:(DE-588b)5008462-8 |6 P:(DE-Juel1)130717 |a Forschungszentrum Jülich |b 3 |k FZJ |
| 913 | 1 | _ | |0 G:(DE-HGF)POF3-521 |1 G:(DE-HGF)POF3-520 |2 G:(DE-HGF)POF3-500 |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
| 914 | 1 | _ | |y 2016 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0550 |2 StatID |a No Authors Fulltext |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-7-20110106 |k PGI-7 |l Elektronische Materialien |x 0 |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-10-20170113 |k PGI-10 |l JARA Institut Green IT |x 1 |
| 980 | _ | _ | |a conf |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a UNRESTRICTED |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-10-20170113 |
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