http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Analysis of the Two-Part SET Switching Process in STO-based ReRAM
La Torre, C. ; Fleck, K. ; Aslam, N. ; Hoffmann-Eifert, S.FZJ* ; Böttger, U. ; Waser, R.FZJ* ; Menzel, S.FZJ*
2016
2016Materials Research Society Fall Meeting, BostonBoston, USA, 27 Nov 2016 - 2 Dec 20162016-11-272016-12-02
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA Institut Green IT (PGI-10)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
Appears in the scientific report
2016
Database coverage:No Authors Fulltext