Conference Presentation (Other) FZJ-2017-00687

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Influence of Stack Order on the Forming and Switching Behavior of HfO2/TiO2 Bilayer Cells for ReRAM Applications

 ;  ;

2016

DPG Tagung, RegensburgRegensburg, GErmany, 6 Mar 2016 - 12 Mar 20162016-03-062016-03-12


Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
Research Program(s):
  1. 524 - Controlling Collective States (POF3-524) (POF3-524)

Appears in the scientific report 2016
Database coverage:
No Authors Fulltext
Click to display QR Code for this record

The record appears in these collections:
Document types > Presentations > Conference Presentations
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database

 Record created 2017-01-19, last modified 2021-01-29



Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)