%0 Conference Paper
%A Hardtdegen, Alexander
%A Hoffmann-Eifert, Susanne
%T Internal Cell Resistance as the Origin of Abrupt Reset Behavior in HfO2-Based Devices Determined from Current Compliance Series
%M FZJ-2017-00689
%D 2016
%B International Memory Workshop
%C 15 May 2016 - 20 May 2016, Paris (France)
Y2 15 May 2016 - 20 May 2016
M2 Paris, France
%F PUB:(DE-HGF)24
%9 Poster
%U https://juser.fz-juelich.de/record/826464