TY  - CONF
AU  - Hardtdegen, Alexander
AU  - Hoffmann-Eifert, Susanne
TI  - Internal Cell Resistance as the Origin of Abrupt Reset Behavior in HfO2-Based Devices Determined from Current Compliance Series
M1  - FZJ-2017-00689
PY  - 2016
T2  - International Memory Workshop
CY  - 15 May 2016 - 20 May 2016, Paris (France)
Y2  - 15 May 2016 - 20 May 2016
M2  - Paris, France
LB  - PUB:(DE-HGF)24
UR  - https://juser.fz-juelich.de/record/826464
ER  -