Poster (Other)

FZJ-2017-00689

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Internal Cell Resistance as the Origin of Abrupt Reset Behavior in HfO2-Based Devices Determined from Current Compliance Series

Hardtdegen, A.FZJ* ; Hoffmann-Eifert, S.FZJ*

2016

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA Institut Green IT (PGI-10)
3. JARA-FIT (JARA-FIT)

Research Program(s):

1. 524 - Controlling Collective States (POF3-524) (POF3-524)

Appears in the scientific report 2016

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Database coverage:
No Authors Fulltext

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