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Contribution to a conference proceedings | FZJ-2017-00844 |
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2016
IEEE
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Please use a persistent id in citations: doi:10.1109/ASDAM.2016.7805899
Abstract: We fabricated and tested hybrid-III-nitride (CdSe nanocrystal/p-GaN/MQW/n-GaN/sapphire) based nano-LEDs and integrated them into a device layout suitable for DC testing and designed for future operation at high frequencies. Our studies provide clear evidence that our technological process for the vertically integrated nano-LED emitters is perfectly suited for long-term operation without any indication of degradation effects. This novel technology shows strong potential for a future single photon based OE circuit.
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