%0 Conference Paper
%A Dunin-Borkowski, Rafal
%T Towards quantitative in situ transmission electron microscopy of working nanoelectronic devices
%M FZJ-2017-01045
%D 2016
%B 1st Sino-German Symposium on Advanced Electron Microscopy and Spectroscopy of Materials
%C 31 Oct 2016 - 4 Nov 2016, Bejing (China)
Y2 31 Oct 2016 - 4 Nov 2016
M2 Bejing, China
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/826828