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Conference Presentation (Invited) FZJ-2017-01045
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Towards quantitative in situ transmission electron microscopy of working nanoelectronic devices



2016

1st Sino-German Symposium on Advanced Electron Microscopy and Spectroscopy of Materials, BejingBejing, China, 31 Oct 2016 - 4 Nov 20162016-10-312016-11-04

Contributing Institute(s):
  1. Mikrostrukturforschung (PGI-5)
  2. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016
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Document types > Presentations > Conference Presentations
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
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 Record created 2017-01-25, last modified 2024-06-10
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