Home > Publications database > Towards quantitative in situ transmission electron microscopy of working nanoelectronic devices > RIS |
TY - CONF AU - Dunin-Borkowski, Rafal TI - Towards quantitative in situ transmission electron microscopy of working nanoelectronic devices M1 - FZJ-2017-01045 PY - 2016 T2 - 1st Sino-German Symposium on Advanced Electron Microscopy and Spectroscopy of Materials CY - 31 Oct 2016 - 4 Nov 2016, Bejing (China) Y2 - 31 Oct 2016 - 4 Nov 2016 M2 - Bejing, China LB - PUB:(DE-HGF)6 UR - https://juser.fz-juelich.de/record/826828 ER -