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@INPROCEEDINGS{DuninBorkowski:826828,
      author       = {Dunin-Borkowski, Rafal},
      title        = {{T}owards quantitative in situ transmission electron
                      microscopy of working nanoelectronic devices},
      reportid     = {FZJ-2017-01045},
      year         = {2016},
      month         = {Oct},
      date          = {2016-10-31},
      organization  = {1st Sino-German Symposium on Advanced
                       Electron Microscopy and Spectroscopy of
                       Materials, Bejing (China), 31 Oct 2016
                       - 4 Nov 2016},
      subtyp        = {Invited},
      cin          = {PGI-5 / ER-C-1},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/826828},
}