%0 Conference Paper
%A Dunin-Borkowski, Rafal
%T Direct measurement of the electric field around an electrically biased atom probe needle in the transmission electron microscope
%M FZJ-2017-01119
%D 2016
%B Atom Probe Tomography amd Microscopy 2016 (55th IFES)"From Science to industry"
%C 12 Jun 2016 - 17 Jun 2016, Gyeongju (South Korea)
Y2 12 Jun 2016 - 17 Jun 2016
M2 Gyeongju, South Korea
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/826903