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Conference Presentation (Invited) FZJ-2017-01119
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Direct measurement of the electric field around an electrically biased atom probe needle in the transmission electron microscope



2016

Atom Probe Tomography amd Microscopy 2016 (55th IFES)"From Science to industry", GyeongjuGyeongju, South Korea, 12 Jun 2016 - 17 Jun 20162016-06-122016-06-17

Contributing Institute(s):
  1. Mikrostrukturforschung (PGI-5)
  2. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016
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Document types > Presentations > Conference Presentations
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
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 Record created 2017-01-26, last modified 2024-06-10
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