000826903 001__ 826903
000826903 005__ 20240610115902.0
000826903 037__ $$aFZJ-2017-01119
000826903 041__ $$aEnglish
000826903 1001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b0$$eCorresponding author
000826903 1112_ $$aAtom Probe Tomography amd Microscopy 2016 (55th IFES)"From Science to industry"$$cGyeongju$$d2016-06-12 - 2016-06-17$$wSouth Korea
000826903 245__ $$aDirect measurement of the electric field around an electrically biased atom probe needle in the transmission electron microscope
000826903 260__ $$c2016
000826903 3367_ $$033$$2EndNote$$aConference Paper
000826903 3367_ $$2DataCite$$aOther
000826903 3367_ $$2BibTeX$$aINPROCEEDINGS
000826903 3367_ $$2DRIVER$$aconferenceObject
000826903 3367_ $$2ORCID$$aLECTURE_SPEECH
000826903 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1485438534_32146$$xInvited
000826903 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000826903 909CO $$ooai:juser.fz-juelich.de:826903$$pVDB
000826903 9141_ $$y2016
000826903 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000826903 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich$$b0$$kFZJ
000826903 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000826903 920__ $$lyes
000826903 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000826903 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x1
000826903 980__ $$aconf
000826903 980__ $$aVDB
000826903 980__ $$aUNRESTRICTED
000826903 980__ $$aI:(DE-Juel1)PGI-5-20110106
000826903 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000826903 981__ $$aI:(DE-Juel1)ER-C-1-20170209