TY  - CONF
AU  - Dunin-Borkowski, Rafal
TI  - Direct measurement of the electric field around an electrically biased atom probe needle in the transmission electron microscope
M1  - FZJ-2017-01119
PY  - 2016
T2  - Atom Probe Tomography amd Microscopy 2016 (55th IFES)"From Science to industry"
CY  - 12 Jun 2016 - 17 Jun 2016, Gyeongju (South Korea)
Y2  - 12 Jun 2016 - 17 Jun 2016
M2  - Gyeongju, South Korea
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/826903
ER  -