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@INPROCEEDINGS{DuninBorkowski:826903,
author = {Dunin-Borkowski, Rafal},
title = {{D}irect measurement of the electric field around an
electrically biased atom probe needle in the transmission
electron microscope},
reportid = {FZJ-2017-01119},
year = {2016},
month = {Jun},
date = {2016-06-12},
organization = {Atom Probe Tomography amd Microscopy
2016 (55th IFES)"From Science to
industry", Gyeongju (South Korea), 12
Jun 2016 - 17 Jun 2016},
subtyp = {Invited},
cin = {PGI-5 / ER-C-1},
cid = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)6},
url = {https://juser.fz-juelich.de/record/826903},
}