%0 Conference Paper
%A Cooper, David
%A Bernier, Nicolas
%A Baumer, Christoph
%A Dunin-Borkowski, Rafal
%A Dittmann, Regina
%T Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
%J Microscopy and microanalysis
%V 22
%N S5
%@ 1435-8115
%C New York, NY
%I Cambridge University Press
%M FZJ-2017-01369
%P 52 - 53
%D 2016
%B 3rd International Conference on Insitu and Correlative Electron Microscopy
%C 11 Oct 2016 - 12 Oct 2016, Saarbrücken (Germany)
Y2 11 Oct 2016 - 12 Oct 2016
M2 Saarbrücken, Germany
%F PUB:(DE-HGF)16 ; PUB:(DE-HGF)8
%9 Journal ArticleContribution to a conference proceedings
%R 10.1017/S1431927616012289
%U https://juser.fz-juelich.de/record/827171