Journal Article/Contribution to a conference proceedings

FZJ-2017-01369

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography

Cooper, D. ; Bernier, N. ; Baumer, C.FZJ* ; Dunin-Borkowski, R.FZJ* ; Dittmann, R.FZJ*

2016
Cambridge University Press New York, NY

This record in other databases:

Please use a persistent id in citations: http://hdl.handle.net/2128/19363  doi:10.1017/S1431927616012289

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)
2. Physik Nanoskaliger Systeme (ER-C-1)
3. Elektronische Materialien (PGI-7)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016

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Database coverage:
; ; ; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; No Authors Fulltext ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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