TY  - CONF
AU  - Cooper, David
AU  - Bernier, Nicolas
AU  - Baumer, Christoph
AU  - Dunin-Borkowski, Rafal
AU  - Dittmann, Regina
TI  - Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
JO  - Microscopy and microanalysis
VL  - 22
IS  - S5
SN  - 1435-8115
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2017-01369
SP  - 52 - 53
PY  - 2016
T2  - 3rd International Conference on Insitu and Correlative Electron Microscopy
CY  - 11 Oct 2016 - 12 Oct 2016, Saarbrücken (Germany)
Y2  - 11 Oct 2016 - 12 Oct 2016
M2  - Saarbrücken, Germany
LB  - PUB:(DE-HGF)16 ; PUB:(DE-HGF)8
DO  - DOI:10.1017/S1431927616012289
UR  - https://juser.fz-juelich.de/record/827171
ER  -